发明名称 CHARGED PARTICLE BEAM IRRADIATION METHOD AND APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a charged particle beam irradiation method and apparatus which enable accurate irradiation of an affected part (target) with a charged particle beam even when the direction of the charged particle beam to be irradiated is changed. SOLUTION: Then a rotary irradiator 2 is used to make a charged particle beam emitted from a synchrotron 1 irradiate a target within an irradiation object from a plurality of directions, in the altering of the direction of the irradiation of the charged particle beam to the target made by the rotary irradiator 2, the energy of the charged particle beam in the synchrotron 1 is changed according to the depth position of the target in the irradiation object.
申请公布号 JP2000202047(A) 申请公布日期 2000.07.25
申请号 JP19990006085 申请日期 1999.01.13
申请人 HITACHI LTD 发明人 AKIYAMA HIROSHI;HIRAMOTO KAZUO;MATSUDA KOJI;SUZUKI HIROYUKI
分类号 A61N5/10;(IPC1-7):A61N5/10 主分类号 A61N5/10
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