发明名称 Method and apparatus for early detection of reliability degradation of electronic devices
摘要 A circuit that senses changes in the electrical characteristics of a guard ring, and generates one or more signals based, at least in part, on the electrical characteristics that are sensed, is incorporated into an integrated circuit. The one or more signals generated by the circuit are indicative of the reliability of the integrated circuit. In one embodiment of the present invention, a first point of the guard ring is electrically coupled to a voltage supply node by a switchable element such as a MOSFET, and at least two points of the guard ring are electrically coupled respectively to two input terminals of a differential amplifier circuit in such a way that voltage changes across the guard ring can be sensed.
申请公布号 US6094144(A) 申请公布日期 2000.07.25
申请号 US19980173513 申请日期 1998.10.15
申请人 INTEL CORPORATION 发明人 DISHONGH, TERRANCE J.;PULLEN, DAVID H.
分类号 G01R31/28;(IPC1-7):G08B21/00 主分类号 G01R31/28
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