发明名称 METHOD FOR FORMING METAL WIRE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a metal wire of a semiconductor device is to eliminate a residue of a photoresist or a relux using the relux, thereby increasing a yield ratio of a product. CONSTITUTION: A method for forming a metal wire of a semiconductor device comprises steps of stacking a dielectric layer and a metal layer(120) in order on a substrate on which a semiconductor device is formed, coating a relux material(130) on the metal layer, performing an exposing and developing process after coating a negative photoresist(132) on the relux layer and forming a photoresist pattern for an upper metal wire, patterning the metal layer to align with a photoresist pattern and forming the metal wire, and removing the photoresist pattern and the relux material. In the exposing process, a negative reticle is used.
申请公布号 KR20000045872(A) 申请公布日期 2000.07.25
申请号 KR19980062474 申请日期 1998.12.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 KIM, HA YEONG;LEE, TAE GUK
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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