发明名称 |
METHOD FOR FORMING METAL WIRE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a metal wire of a semiconductor device is to eliminate a residue of a photoresist or a relux using the relux, thereby increasing a yield ratio of a product. CONSTITUTION: A method for forming a metal wire of a semiconductor device comprises steps of stacking a dielectric layer and a metal layer(120) in order on a substrate on which a semiconductor device is formed, coating a relux material(130) on the metal layer, performing an exposing and developing process after coating a negative photoresist(132) on the relux layer and forming a photoresist pattern for an upper metal wire, patterning the metal layer to align with a photoresist pattern and forming the metal wire, and removing the photoresist pattern and the relux material. In the exposing process, a negative reticle is used.
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申请公布号 |
KR20000045872(A) |
申请公布日期 |
2000.07.25 |
申请号 |
KR19980062474 |
申请日期 |
1998.12.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
KIM, HA YEONG;LEE, TAE GUK |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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