发明名称 METHOD FOR FORMING LOCAL INTERCONNECTION LINE IN SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming local interconnection line in a semiconductor device is to prevent a residual particle from being remained on the interlayer insulating layer after performing a blanket etch and prevent a barrier metal to be over-etched. CONSTITUTION: A local interconnection line forming method comprises the steps of: forming a semiconductor device including a gate electrode(102) and a source and drain region(104) in a semiconductor substrate(100); depositing a planarizing interlayer insulating layer(110) on the semiconductor substrate; forming a contact hole(112) that exposes a part of the gate electrode and a part of a surface of the source and drain region adjacent thereto in the planarizing interlayer insulating layer; and forming a selective metastable polysilicon layer(114) that electrically connects the source and drain region with the gate electrode.
申请公布号 KR20000045869(A) 申请公布日期 2000.07.25
申请号 KR19980062471 申请日期 1998.12.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 YOON, JONG WON;PARK, HYEON SIK
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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