发明名称 |
METHOD FOR FORMING LOCAL INTERCONNECTION LINE IN SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming local interconnection line in a semiconductor device is to prevent a residual particle from being remained on the interlayer insulating layer after performing a blanket etch and prevent a barrier metal to be over-etched. CONSTITUTION: A local interconnection line forming method comprises the steps of: forming a semiconductor device including a gate electrode(102) and a source and drain region(104) in a semiconductor substrate(100); depositing a planarizing interlayer insulating layer(110) on the semiconductor substrate; forming a contact hole(112) that exposes a part of the gate electrode and a part of a surface of the source and drain region adjacent thereto in the planarizing interlayer insulating layer; and forming a selective metastable polysilicon layer(114) that electrically connects the source and drain region with the gate electrode.
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申请公布号 |
KR20000045869(A) |
申请公布日期 |
2000.07.25 |
申请号 |
KR19980062471 |
申请日期 |
1998.12.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
YOON, JONG WON;PARK, HYEON SIK |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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