| 摘要 |
The present invention is to provide an apparatus for testing the pattern of PCB and a method thereof. The apparatus according to the present invention comprising a PCB to be tested and a test means for examining an electrical state of the pattern of the PCB to be tested, said test means comprising an analyzer for examining the functions of circuits, components, or test points and their relations with each other; a connection PCB including patterns formed correspond to the test points of the patterns of the PCB to be tested, and holes for receiving probes which make electrical contact between the PCB to be tested and the test means; and at least one fixture connected to said connection PCB for interfacing between said analyzer and the PCB to be tested by said probes. Also, the method according to the present invention comprising the steps of applying a predetermined overcurrent to the patterns of the PCB to be tested; and detecting a variety of resistance value on the patterns of the PCB to be tested thereby examining a connection state of the patterns. |
