发明名称 Composite particles and production process thereof, aqueous dispersion composition for chemical polishing, and process for manufacture of semiconductor device
摘要 <p>The present invention provides composite particles with sufficient strength and hardness and excellent heat resistance, a production process thereof, an aqueous dispersion containing the composite particles, a CMP slurry which is suitable for manufacture of semiconductor devices, and a process for manufacture of semiconductor devices that employs it. The composite particles are prepared by bonding a silane coupling agent and the like, to divinylbenzene polymer particles and then reacting a specific metal alkoxide, colloidal metal oxide and colloidal silica therewith to form a metal compound section and the like, consisting of a metalloxane bond-containing section or metal oxide particle section on at least one of the interior and surface of the polymer particles. The metal compound section, and the like. can also be formed without using a silane coupling agent. The metalloxane bond-containing section, metal oxide particle section and the like, are preferably bonded by chemical bonding and/or non-chemical bonding to the polymer particles via a silane coupling agent and the like, or directly, but they may also be sequestered without bonding. CMP slurries containing these particles can be advantageously utilized for manufacture of various semiconductor devices, and particularly for polishing of wafer surfaces.</p>
申请公布号 EP1020488(A2) 申请公布日期 2000.07.19
申请号 EP20000100909 申请日期 2000.01.18
申请人 KABUSHIKI KAISHA TOSHIBA;JSR CORPORATION 发明人 YANO, HIROYUKI;MINAMIHABA, GAKU;MATSUI, YUKITERU;OKUMURA, KATSUYA;MOTONARI, MASAYUKI;HATTORI, MASAYUKI;IIO, AKIRA
分类号 C09K3/14;C08G83/00;C08K3/34;C09G1/02;H01L21/306;H01L21/3105;H01L21/321;(IPC1-7):C08J3/205;H01L21/02 主分类号 C09K3/14
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