| 摘要 |
According to this invention a mount for X-ray tubes is rotatable around the axis of an X-ray which is incident upon a specimen. A support for the mount is rotatable around a straight line passing through the point at which the X-ray is incident upon the specimen and a holder for a first guide rail is rotatable around a straight line which intersects a first straight line at right angles. Guide rails permit the X-ray sources and diffracted X-ray detectors to travel along such guide rails, so that the internal strain, residual austenite and crystal orientation of the specimen can be measured without being limited by the configuration of specimen's surface.
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