发明名称 Self-aligned SOI device with body contact and NiSi2 gate
摘要 A self-aligned SOI device with body contact and silicide gate. The SOI device is formed using an ordinary substrate such as silicon. A silicide gate is self-aligned and formed from re-crystallization of nickel and amorphous silicon. The self-aligned silicide gate includes gate contact areas, and is self-aligned with respect to the gate opening, the source and drain regions and a nitride isolation layer. Nickel spacers deposited adjacent the isolation layer, and amorphous silicon deposited between the nickel spacers, form the self-aligned silicide gate through a silicidation process.
申请公布号 US6091123(A) 申请公布日期 2000.07.18
申请号 US19980093580 申请日期 1998.06.08
申请人 ADVANCED MICRO DEVICES 发明人 KRIVOKAPIC, ZORAN;PRAMANICK, SHEKHAR
分类号 H01L21/20;H01L21/28;H01L21/336;H01L29/06;H01L29/423;H01L29/49;(IPC1-7):H01L21/336 主分类号 H01L21/20
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