| 摘要 |
PROBLEM TO BE SOLVED: To measure the shifted amount of a space distance between sensor chips without breaking a structure and functions of a sensor module, by detecting a waveform signal corresponding to the predetermined pattern of a test diagram by sensors located to each end point of adjacent sensor chips. SOLUTION: A test diagram having a predetermined pattern (black stripes 32 and 34 and, a white stripe 38) is scanned by a contact type image sensor module constituted of a plurality of image sensor chips 12 and 14 each, including a plurality of sensors and arranged on a main board 10. Signal waveforms VP1 and VP2 corresponding to the predetermined pattern are detected by sensors P1 and P2 of end points of the adjacent sensor chips 12 and 14. If the two sensors P1 and P2 have, for example, a substantial error Δy in a vertical direction (y), signal waveforms VP1 and VP2 corresponding to the black and white stripes 32, 34 and 38 detected by the sensors P1 and P2 do not overlap. A space distance (namely, the substantial error Δy) between the sensor chips 12 and 14 is calculated from the two signal waveforms VP1 and VP2.
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