发明名称 Method and apparatus for measuring gas concentration using a semiconductor laser
摘要 A system and method for determining the concentration of an analyte such as oxygen in an unknown gas sample. A Vertical Cavity Surface Emitting Laser (VCSEL) is used as a variable wavelength light source which is "swept" through a wavelength range by varying the drive signal applied thereto. Quantitative spectroscopic analysis of the unknown gas sample is performed without the requirement of feedback circuitry for tuning the light source to the characteristic frequency of an analyte. Instead, the VCSEL is repeatedly "swept" through a range of frequencies determined by the drive signal, and the absorption is measured by the detector. The absorption lines do not always occur at the same place but instead move along around during the sweep based on the temperature and baseline current. The absorption at a particular wavelength may be determined by overlaying the drive signal and its timing information over the detected absorption signal.
申请公布号 US6091504(A) 申请公布日期 2000.07.18
申请号 US19980082662 申请日期 1998.05.21
申请人 SQUARE ONE TECHNOLOGY, INC. 发明人 WALKER, STEPHEN D.;NICHOLS, ROBERT A.;CURNAN, WILLIAM A.;SVAI, SOPHAT;BRAIG, JAMES R.;GOLDBERGER, DANIEL S.
分类号 G01N21/39;(IPC1-7):G01N21/00 主分类号 G01N21/39
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