发明名称 FLUORESCENCE X-RAY SPECTROMETER
摘要 <p>PROBLEM TO BE SOLVED: To obtain a fluorescence X-ray spectrometer easy in analytical operation and enabling quantitative analysis, even if the discrimination number of a sample is not definite. SOLUTION: Since a series of operations, wherein a sample S fed to an analyzing position by a start command is irradiated with X-rays and the intensity of fluorescent X-rays generated from the sample S is measured and a group to which the sample S belongs, is selected to quantitatively analyze the sample S are executed, analytical operation can be executed easily. Even if the discrimination number of the sample S is unclear, the quantitative analysis of the sample S becomes possible. Since a group, to which the sample S belongs is selected from a qualitative or semi-quantitative analytical result based on a first measured result, even if there are fluctuations in the measured value of the intensity of fluorescent X-rays, the errors in judgment of the sample S can be reduced.</p>
申请公布号 JP2000199749(A) 申请公布日期 2000.07.18
申请号 JP19980377186 申请日期 1998.12.29
申请人 RIGAKU INDUSTRIAL CO 发明人 SHIZUTOSHI KOHEI;FURUSAWA EIICHI
分类号 G01N23/223;G01N35/02;(IPC1-7):G01N23/223 主分类号 G01N23/223
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