发明名称 DIE BONDING MATERIAL AND BONDING METHOD
摘要 PROBLEM TO BE SOLVED: To prevent reflow cracks in a solder reflow step when a semiconductor device is mounted. SOLUTION: In a bonding method, a semiconductor device includes a supporting material, a semiconductive element 8, a bonding material 1 for bonding a semiconductor element, and a sealing resin 9 for sealing the semiconductor element. The semiconductor element 10 is bonded to a lead frame 5 through an organic bonding material 1 in a film form with a coefficient of water absorption of 1.5 vol.% or below, a saturation coefficient of water absorption of 1.0 vol.% or below, a residual volatile component of 3.0 wt.% or below, or a modulus of elasticity of 10 MPa or below.
申请公布号 JP2000200793(A) 申请公布日期 2000.07.18
申请号 JP20000043233 申请日期 2000.02.21
申请人 HITACHI CHEM CO LTD 发明人 TAKEDA SHINJI;MASUKO TAKASHI;YUSA MASAMI;KIKUCHI NOBURU;MIYADERA YASUO;MAEKAWA IWAO;YAMAZAKI MITSUO;KAGEYAMA AKIRA;KANEDA AIZO
分类号 H01L21/52;H01L21/58;H01L23/495 主分类号 H01L21/52
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