发明名称 FABRICATION METHOD OF DRAM
摘要 PURPOSE: A fabrication method of DRAM is provided to reduce metal contact etching target against active areas to decrease the loss of the active area due to over-etching and form a capacitor contact plug in one time. CONSTITUTION: A fabrication method of DRAM comprises steps of: forming a conductive layer on a substrate; patterning the conductive layer to form bit lines; forming an insulation film on the substrate; selectively etching the insulation film to form a bit line contact area; forming a bit line contact plug within the contact area; etching the insulation film instead of constant thickness; forming spacers on sides of the exposed contact plug; and depositing silicon on the substrate.
申请公布号 KR20000044673(A) 申请公布日期 2000.07.15
申请号 KR19980061172 申请日期 1998.12.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 JANG, JIN MAN
分类号 H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/8242
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