发明名称 |
FABRICATION METHOD OF DRAM |
摘要 |
PURPOSE: A fabrication method of DRAM is provided to reduce metal contact etching target against active areas to decrease the loss of the active area due to over-etching and form a capacitor contact plug in one time. CONSTITUTION: A fabrication method of DRAM comprises steps of: forming a conductive layer on a substrate; patterning the conductive layer to form bit lines; forming an insulation film on the substrate; selectively etching the insulation film to form a bit line contact area; forming a bit line contact plug within the contact area; etching the insulation film instead of constant thickness; forming spacers on sides of the exposed contact plug; and depositing silicon on the substrate.
|
申请公布号 |
KR20000044673(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980061172 |
申请日期 |
1998.12.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
JANG, JIN MAN |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|