发明名称 FABRICATION METHOD OF CONTACTS FOR SEMICONDUCTOR DEVICE
摘要 PURPOSE: A fabrication method of contacts for semiconductor device is provided to simultaneously etch an oxide layer and a nitride layer without separate other process to simplify process, and to reduce the short-circuit ratio between lines to increase productivity of the device. CONSTITUTION: A fabrication method of contacts for semiconductor device comprises steps of: sequentially forming word lines and an oxide layer pattern for a hard mask on a silicon substrate; forming a nitride layer; sequentially forming a BPSG film and a photoresist pattern for a contact mask on the nitride layer; and simultaneously removing the BPSG film and the bottom of the nitride layer to form a contact hole.
申请公布号 KR20000045442(A) 申请公布日期 2000.07.15
申请号 KR19980062000 申请日期 1998.12.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 YOU, JAE SEON
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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