发明名称 METHOD FOR MANUFACTURING TRIPLE WELL OF SEMICONDUCTOR ELEMENT
摘要 PURPOSE: A method for manufacturing a triple well of a semiconductor element is provided to reduce a current leakage and to ensure a sufficient thermal budget by performing a heat treatment process after an ion implantation process has been finished. CONSTITUTION: A first deep conductive well ion implantation area(44) is formed on a semiconductor substrate(51). Impurities in the first deep conductive well ion implantation area(44) are activated by a rapid heat treatment. Then, a first conductive impurity ion implantation area is formed. After that, a second conductive impurity ion implantation area is formed. Finally, the impurities implanted into the semiconductor substrate(51) are activated by a furnace heat treatment.
申请公布号 KR20000044662(A) 申请公布日期 2000.07.15
申请号 KR19980061161 申请日期 1998.12.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 OH, JAE GEUN
分类号 H01L21/265;(IPC1-7):H01L21/265 主分类号 H01L21/265
代理机构 代理人
主权项
地址