发明名称 |
METHOD FOR MANUFACTURING TRIPLE WELL OF SEMICONDUCTOR ELEMENT |
摘要 |
PURPOSE: A method for manufacturing a triple well of a semiconductor element is provided to reduce a current leakage and to ensure a sufficient thermal budget by performing a heat treatment process after an ion implantation process has been finished. CONSTITUTION: A first deep conductive well ion implantation area(44) is formed on a semiconductor substrate(51). Impurities in the first deep conductive well ion implantation area(44) are activated by a rapid heat treatment. Then, a first conductive impurity ion implantation area is formed. After that, a second conductive impurity ion implantation area is formed. Finally, the impurities implanted into the semiconductor substrate(51) are activated by a furnace heat treatment.
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申请公布号 |
KR20000044662(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980061161 |
申请日期 |
1998.12.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
OH, JAE GEUN |
分类号 |
H01L21/265;(IPC1-7):H01L21/265 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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