发明名称 METHOD FOR PRODUCING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for producing a semiconductor device is to shorten a process time by simultaneously removing and washing a silicide layer in a pattern-removal process and to improve productivity by reducing use amount of chemical. CONSTITUTION: A method for producing a semiconductor device comprises the steps of: forming a word line having a polysilicon layer and a silicide layer on the polysilicon layer on a semiconductor substrate; depositing an interlayer insulation film on the semiconductor substrate including the word line and then forming a pattern of photosensitive film having an opening corresponding to a contact hole for exposing the silicide layer on the interlayer insulation film; exposing the silicide layer by using a pattern of the photosensitive film as a mask; a step of accomplishing in-situ a process of removing the pattern of the photosensitive film, a process of etching and washing the silicide layer and a process of removing a natural oxidization film present in the contact hole; and contacting the polysilicon layer of the bit line with the polysilicon layer of the word line.
申请公布号 KR20000043491(A) 申请公布日期 2000.07.15
申请号 KR19980059884 申请日期 1998.12.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, GYE WON;BAEK, GI JEONG;GONG, SEONG BAE
分类号 H01L21/311;(IPC1-7):H01L21/311 主分类号 H01L21/311
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