发明名称 |
METHOD FOR PRODUCING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for producing a semiconductor device is to shorten a process time by simultaneously removing and washing a silicide layer in a pattern-removal process and to improve productivity by reducing use amount of chemical. CONSTITUTION: A method for producing a semiconductor device comprises the steps of: forming a word line having a polysilicon layer and a silicide layer on the polysilicon layer on a semiconductor substrate; depositing an interlayer insulation film on the semiconductor substrate including the word line and then forming a pattern of photosensitive film having an opening corresponding to a contact hole for exposing the silicide layer on the interlayer insulation film; exposing the silicide layer by using a pattern of the photosensitive film as a mask; a step of accomplishing in-situ a process of removing the pattern of the photosensitive film, a process of etching and washing the silicide layer and a process of removing a natural oxidization film present in the contact hole; and contacting the polysilicon layer of the bit line with the polysilicon layer of the word line.
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申请公布号 |
KR20000043491(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980059884 |
申请日期 |
1998.12.29 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, GYE WON;BAEK, GI JEONG;GONG, SEONG BAE |
分类号 |
H01L21/311;(IPC1-7):H01L21/311 |
主分类号 |
H01L21/311 |
代理机构 |
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代理人 |
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地址 |
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