INTRODUCING CIRCUIT INTO SPECIAL TEST MODE OF EDO DRAM

摘要

PURPOSE: An introducing circuit into a special test mode of an EDO(extended data output) DRAM(dynamic random access memory) is provided to reduce test costs and to shorten the introducing time of a special test mode. CONSTITUTION: One of NCs(no connection pins) is connected to a pad and dynamic buffers(32-36) are coupled with the necessary number of address pins. A special test mode is introduced into one of several tests by using strobe signals of the buffers immediately when a wcbr signal is enabled. Therefore, the introducing time of special mode test is shortened and the test cost is reduced remarkably.