发明名称 |
METHOD FOR FABRICATING TANTALUM OXIDE FILM CAPACITOR USING PLASMA CHEMICAL VAPOR DEPOSITION |
摘要 |
PURPOSE: A method for fabricating a Ta2O5 film capacitor using PECVD(Plasma Chemical Vapor Deposition) method is provided which can reduce the process steps and can crystallize the Ta2O5 film in a relatively low temperature. CONSTITUTION: A method for fabricating a Ta2O5 capacitor using PECVD removes impurities in a Ta2O5 film at a temperature lower than in a diffusion furnace and at the same time crystallizes the Ta2O5 film, by performing Ta2O5 treatment using plasma energy by controlling the chamber temperature and the plasma density adequately using a PECVD chamber after forming the Ta2O5 film. The method includes the steps of: forming a bottom electrode(1); forming an amorphous Ta2O5 film(3A) on the bottom electrode; treating the Ta2O5 film in the oxygen atmosphere; removing impurities in the Ta2O5 film and at the same time crystallizing the amorphous Ta2O5 film by thermally processing the Ta2O5 and at the same time plasma processing; and forming a top electrode(4) on the Ta2O5.
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申请公布号 |
KR20000041428(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980057287 |
申请日期 |
1998.12.22 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
OH, SOO JIN;KOO, JA CHOON;KIM, KYUNG MIN |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
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