发明名称 |
METHOD FOR FORMING FINE CONTACT HOLE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a fine contact hole of a semiconductor device is provided to form a fine contact hole by using a chemical mechanical polishing method and a dry etch method. CONSTITUTION: A method for forming a fine contact hole of a semiconductor device comprises the following steps. Voids(8) between word lines(3) are narrowly formed when forming the word lines as a conductive layer on a semiconductor substrate(100). An insulating oxide layer(7) is formed when depositing an insulating oxide layer. An entrance portion of the voids of a contact hole area is exposed by polishing a predetermined thickness of the insulating oxide layer. The insulating oxide layer is etched to form a contact hole for exposing the silicon substrate of the contact hole area by using a dry etch method.
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申请公布号 |
KR20000045324(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980061882 |
申请日期 |
1998.12.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
LEE, BYUNG CHEOL |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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