发明名称 METHOD FOR FORMING FINE CONTACT HOLE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a fine contact hole of a semiconductor device is provided to form a fine contact hole by using a chemical mechanical polishing method and a dry etch method. CONSTITUTION: A method for forming a fine contact hole of a semiconductor device comprises the following steps. Voids(8) between word lines(3) are narrowly formed when forming the word lines as a conductive layer on a semiconductor substrate(100). An insulating oxide layer(7) is formed when depositing an insulating oxide layer. An entrance portion of the voids of a contact hole area is exposed by polishing a predetermined thickness of the insulating oxide layer. The insulating oxide layer is etched to form a contact hole for exposing the silicon substrate of the contact hole area by using a dry etch method.
申请公布号 KR20000045324(A) 申请公布日期 2000.07.15
申请号 KR19980061882 申请日期 1998.12.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 LEE, BYUNG CHEOL
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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