发明名称 PROGRAM OF FLASH MEMORY CELL AND ELIMINATING METHOD THEREOF
摘要 PURPOSE: A program of a flash memory cell and an eliminating method thereof are provided to increase reliability of a device by improving a cycling endurance with reducing a source joint current. CONSTITUTION: To eliminate a flash memory cell, 10V voltage from a positive charge pump circuit(9) is fed to a control gate(5) and 5V voltage from a negative charge pump circuit(8) is fed to a source(6) at 10msec of pulse. A proper resistance is inserted between the source and the negative charge pump circuit. A drain(7) is floated and 0V voltage is fed to a semiconductor substrate(1). Therefore, stored electric charge is drawn to start an erase. A voltage depression is generated in source joint current by the resistance to reduce source voltage of the cell. Thus, a tunnel oxide film has low electric charge difference and source junction current is reduced.
申请公布号 KR20000043889(A) 申请公布日期 2000.07.15
申请号 KR19980060327 申请日期 1998.12.29
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 AHN, BYUNG JIN;LEE, HUI GI;KIM, MIN GYU
分类号 G11C16/00;(IPC1-7):G11C16/00 主分类号 G11C16/00
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