发明名称 |
PROGRAM OF FLASH MEMORY CELL AND ELIMINATING METHOD THEREOF |
摘要 |
PURPOSE: A program of a flash memory cell and an eliminating method thereof are provided to increase reliability of a device by improving a cycling endurance with reducing a source joint current. CONSTITUTION: To eliminate a flash memory cell, 10V voltage from a positive charge pump circuit(9) is fed to a control gate(5) and 5V voltage from a negative charge pump circuit(8) is fed to a source(6) at 10msec of pulse. A proper resistance is inserted between the source and the negative charge pump circuit. A drain(7) is floated and 0V voltage is fed to a semiconductor substrate(1). Therefore, stored electric charge is drawn to start an erase. A voltage depression is generated in source joint current by the resistance to reduce source voltage of the cell. Thus, a tunnel oxide film has low electric charge difference and source junction current is reduced.
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申请公布号 |
KR20000043889(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980060327 |
申请日期 |
1998.12.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
AHN, BYUNG JIN;LEE, HUI GI;KIM, MIN GYU |
分类号 |
G11C16/00;(IPC1-7):G11C16/00 |
主分类号 |
G11C16/00 |
代理机构 |
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地址 |
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