发明名称 HIGH-SPEED BURN-IN TEST BOARD FOR INTEGRATED CIRCUIT PRODUCT
摘要 PURPOSE: A high-speed burn-in test board is provided to be capable of testing in a high speed by removing a cause of an electromagnetic induction voltage noise and a parasite load capacitance. CONSTITUTION: In a high-speed burn-in test board, a ferrite core is inserted between an input/output terminal and an input/output part of a burn-in test equipment, or at an interconnection line for an input/output terminal of a socket for a test on a test board, in order to prevent an electromagnetic noise. Printed circuit board patterns(1,2) of a power supply and a ground voltage are divided according to each test product group(A,B to n), and switches(6-1 to 6-n) are respectively installed between power and ground supply lines of each product group and a power supply device so as to supply the power supply voltage and the ground voltage only to a product group to be tested.
申请公布号 KR20000041167(A) 申请公布日期 2000.07.15
申请号 KR19980056962 申请日期 1998.12.16
申请人 KIM, YOUNG SOOL 发明人 KIM, YOUNG SOOL
分类号 G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/28
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