发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method of manufacturing a semiconductor device is to prevent the generation of a weak point on a metal layer formed as a conductive line on a contact hole having an oxide layer on its bottom edge. CONSTITUTION: A method of manufacturing a semiconductor device comprises the steps of: forming a gate(33) on a semiconductor substrate(31); forming an insulating layer(36) on the whole surface of the gate; selectively etching the insulating layer to form a first contact hole; forming an intermediate layer(39); forming a second contact hole by selectively etching the intermediate layer with the second contact hole wider than the first contact hole to expose the insulating layer on its bottom edge; and forming a conductive line(41).
申请公布号 KR20000041133(A) 申请公布日期 2000.07.15
申请号 KR19980056916 申请日期 1998.12.21
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 KIM, YONG GUK
分类号 H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/336
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