发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of manufacturing a semiconductor device is to prevent the generation of a weak point on a metal layer formed as a conductive line on a contact hole having an oxide layer on its bottom edge. CONSTITUTION: A method of manufacturing a semiconductor device comprises the steps of: forming a gate(33) on a semiconductor substrate(31); forming an insulating layer(36) on the whole surface of the gate; selectively etching the insulating layer to form a first contact hole; forming an intermediate layer(39); forming a second contact hole by selectively etching the intermediate layer with the second contact hole wider than the first contact hole to expose the insulating layer on its bottom edge; and forming a conductive line(41).
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申请公布号 |
KR20000041133(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980056916 |
申请日期 |
1998.12.21 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
KIM, YONG GUK |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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