发明名称 TESTER FOR SILICON CONTROLLED RECTIFIER AND GATE PULSE TRANSFORMER
摘要 PURPOSE: A test apparatus is provided to perform easily, reliably and exactly a test under the operating condition similar to an actual operating condition by flowing actually operating current into a silicon controlled rectifier and a gate pulse transformer(GPT) to perform an operating test. CONSTITUTION: A test apparatus includes a waveform generating unit(11) for generating one of a sine waveform, a rectangular waveform and a triangular waveform. An output control and amplifier(12) adjusts a voltage of a rectangular waveform to 0 - 25V and then amplifies the voltage using a low frequency amplifier. A gate pulse transformer(GPT)(13) transforms the signal from the output control and amplifier(12). A selecting unit(18) selects only an output of the amplifier(12) from the outputs of the GPT(13) to display it a display unit(21). The display unit(21) displays the output of the GPT(13).
申请公布号 KR100262209(B1) 申请公布日期 2000.07.15
申请号 KR19970045985 申请日期 1997.09.05
申请人 KOREA POWER PLANT SERVICE CO.,LTD. 发明人 PAK, HO CHEOL
分类号 G01R31/00;(IPC1-7):G01R31/00 主分类号 G01R31/00
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