发明名称 |
TESTER FOR SILICON CONTROLLED RECTIFIER AND GATE PULSE TRANSFORMER |
摘要 |
PURPOSE: A test apparatus is provided to perform easily, reliably and exactly a test under the operating condition similar to an actual operating condition by flowing actually operating current into a silicon controlled rectifier and a gate pulse transformer(GPT) to perform an operating test. CONSTITUTION: A test apparatus includes a waveform generating unit(11) for generating one of a sine waveform, a rectangular waveform and a triangular waveform. An output control and amplifier(12) adjusts a voltage of a rectangular waveform to 0 - 25V and then amplifies the voltage using a low frequency amplifier. A gate pulse transformer(GPT)(13) transforms the signal from the output control and amplifier(12). A selecting unit(18) selects only an output of the amplifier(12) from the outputs of the GPT(13) to display it a display unit(21). The display unit(21) displays the output of the GPT(13).
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申请公布号 |
KR100262209(B1) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19970045985 |
申请日期 |
1997.09.05 |
申请人 |
KOREA POWER PLANT SERVICE CO.,LTD. |
发明人 |
PAK, HO CHEOL |
分类号 |
G01R31/00;(IPC1-7):G01R31/00 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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