发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to form a uniform thickness of a screen thin film by using an etch barrier. CONSTITUTION: A method for manufacturing a semiconductor device comprises the following steps. An accumulating structure of a gate insulating layer(14) and a gate electrode(16a) is formed on an upper portion of a wafer(12) with a chip area(I) and an EM box(II). A screen thin film(18) and an etch barrier are formed on the upper portion of the wafer. The etching barrier and an insulating layer having an etch selectivity are formed on an upper portion of the etch barrier. An insulating layer spacer(22) is formed at a side wall of the accumulating structure by etching the insulating layer. A thickness of the screen thin film is formed uniformly by etching the etch barrier.
申请公布号 KR20000043223(A) 申请公布日期 2000.07.15
申请号 KR19980059573 申请日期 1998.12.28
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 GEUM, DONG YEOL;KIM, YOUNG SEOK;AHN, JUN GWON;NAM, GI BONG
分类号 H01L21/311;(IPC1-7):H01L21/311 主分类号 H01L21/311
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