发明名称 METHOD OF FORMING CAPACITOR
摘要 PURPOSE: A method of forming a capacitor is provided to reduce a particle at a patterning step by forming a spacer around a post of a charge storage electrode. CONSTITUTION: A method of forming a capacitor comprises forming a first insulation film(23) on a silicon substrate(21) in which a junction region(22) is formed. A contact hole is formed by selectively etching the first insulation film(23), to thereby expose the junction region(22). A first polysilicon layer(25) is formed so as to fill the contact hole sufficiently. A second insulation film(26) and a second polysilicon layer(27) are sequentially formed on the first silicon layer. After patterning the second polysilicon layer(27), the second insulation film(26) and the first polysilicon layer(25), a polysilicon spacer(28) is formed at sidewalls of the patterned layers(27,26,25), to thereby form a charge storage electrode consisting of the second polysilicon layer(27), the second insulation film(26), the first polysilicon layer(25) and the spacer(28).
申请公布号 KR20000044888(A) 申请公布日期 2000.07.15
申请号 KR19980061391 申请日期 1998.12.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 YEO, IN SEOK
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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