发明名称 |
METHOD OF FORMING TITANIUM POLYCIDE GATE ELECTRODE |
摘要 |
PURPOSE: A method of forming a titanium polycide gate electrode is to suppress an abnormal oxidation of a silicide film. CONSTITUTION: A method of forming a titanium polycide gate comprises steps of: forming a gate dielectric film(21) and a polysilicon film(22) on a semiconductor substrate(20); forming a titanium silicide film on the polysilicon film; etching the titanium silicide film and the polysilicon film to form a gate electrode pattern; and annealing the substrate under an atmosphere of N2 gas to form a TiN film on an exposed side wall of the titanium silicide film, and forming a silicon surplus region on the titanium silicide film; removing the TiN film; and processing a gate re-oxidation. The step of forming titanium silicide film includes a step of annealing the substrate to transform the titanium silicide film from an amorphous phase into a crystalline phase.
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申请公布号 |
KR20000041456(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980057315 |
申请日期 |
1998.12.22 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
JANG, SE EOK |
分类号 |
H01L21/28;H01L21/336;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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地址 |
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