发明名称 |
METHOD FOR PLANARIZING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A planarizing method is to increase a marginal degree of a mask process, an etching process and a metal deposition process and to remove an increase of contact resistance and prevent degradation of leakage current characteristic in a junction region. CONSTITUTION: A method for planarizing a semiconductor device comprises the steps of: providing a substrate having a cell region and a peripheral region; flattening firstly the regions by using a first photosensitive film; forming a second photosensitive film, a first sacrificing insulation film and a third photosensitive film in order on entire top surface; forming a metal line(152) after removing the photosensitive films; depositing a metal interlayer insulation film(121) on entire top surface and flattening secondly the regions by using a fourth photosensitive film; forming a fifth photosensitive film, a second sacrificing insulation film and a sixth photosensitive film in order on entire top surface; removing an exposed metal line in the cell region and then removing the fourth and the fifth photosensitive films in the peripheral region.
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申请公布号 |
KR20000043895(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980060333 |
申请日期 |
1998.12.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
JEONG, MYEONG JUN |
分类号 |
H01L21/312;(IPC1-7):H01L21/312 |
主分类号 |
H01L21/312 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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