发明名称 METHOD FOR PLANARIZING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A planarizing method is to increase a marginal degree of a mask process, an etching process and a metal deposition process and to remove an increase of contact resistance and prevent degradation of leakage current characteristic in a junction region. CONSTITUTION: A method for planarizing a semiconductor device comprises the steps of: providing a substrate having a cell region and a peripheral region; flattening firstly the regions by using a first photosensitive film; forming a second photosensitive film, a first sacrificing insulation film and a third photosensitive film in order on entire top surface; forming a metal line(152) after removing the photosensitive films; depositing a metal interlayer insulation film(121) on entire top surface and flattening secondly the regions by using a fourth photosensitive film; forming a fifth photosensitive film, a second sacrificing insulation film and a sixth photosensitive film in order on entire top surface; removing an exposed metal line in the cell region and then removing the fourth and the fifth photosensitive films in the peripheral region.
申请公布号 KR20000043895(A) 申请公布日期 2000.07.15
申请号 KR19980060333 申请日期 1998.12.29
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 JEONG, MYEONG JUN
分类号 H01L21/312;(IPC1-7):H01L21/312 主分类号 H01L21/312
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