发明名称 METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming capacitor of semiconductor device is provided to form a cylinder type capacitor by a simple and stable process using two contact masks, thereby enhancing performance and reliability. CONSTITUTION: A method for forming capacitor of semiconductor device comprises steps of: forming a first etching barrier layer and patterning it using a first storage electrode contact mask; forming an interlayer insulation film; forming a second etching barrier layer and patterning it using a second storage electrode contact mask; etching the insulation film and a lower insulation layer using the first/second etching barrier layers to form a storage electrode contact hole exposing the substrate; forming a first conductor; forming a sacrifice insulation film filling the contact hole; forming a cylinder type storage electrode by flattening etching process; and forming a second conductor consisted in a dielectric film and a plate electrode.
申请公布号 KR20000045481(A) 申请公布日期 2000.07.15
申请号 KR19980062039 申请日期 1998.12.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 AHN, JUN GWON;HWANG, YOUNG HO
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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