发明名称 |
METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming capacitor of semiconductor device is provided to form a cylinder type capacitor by a simple and stable process using two contact masks, thereby enhancing performance and reliability. CONSTITUTION: A method for forming capacitor of semiconductor device comprises steps of: forming a first etching barrier layer and patterning it using a first storage electrode contact mask; forming an interlayer insulation film; forming a second etching barrier layer and patterning it using a second storage electrode contact mask; etching the insulation film and a lower insulation layer using the first/second etching barrier layers to form a storage electrode contact hole exposing the substrate; forming a first conductor; forming a sacrifice insulation film filling the contact hole; forming a cylinder type storage electrode by flattening etching process; and forming a second conductor consisted in a dielectric film and a plate electrode.
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申请公布号 |
KR20000045481(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980062039 |
申请日期 |
1998.12.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
AHN, JUN GWON;HWANG, YOUNG HO |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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