| 摘要 |
PURPOSE: An apparatus for testing an integrated circuit is provided to test a badness of an integrated circuit exactly by classifying a connection pin and a type of the integrated circuit. CONSTITUTION: An integrated circuit testing apparatus comprises a power supply part(10), a voltage measuring part(20), a division part(30), a logic driver(40) and a logic sensor(50). The power supply part(10) supplies a power to an integrated circuit to be tested, and the division part(30) divides an output voltage through each pin of the integrated circuit. The voltage measuring part(20) measures an output voltage from the division part(30), and the logic driver(40) outputs a logic signal to the integrated circuit. The logic sensor(50) measures a logic signal from the integrated circuit. |
