发明名称 |
FABRICATION METHOD OF SOI DEVICE |
摘要 |
PURPOSE: A fabrication method of SOI(Silicon On insulator) device is provided to realize DT-MOS device controllable threshold voltage in accordance with operational conditions without adding an area for connecting to a gate. CONSTITUTION: A fabrication method of SOI device comprises steps of: sequentially forming a gate insulation film and a first conductor on the SOI substrate on which a lower semiconductor substrate, an embedded insulation film and an upper semiconductor substrate are stacked; sequentially etching the first conductor, gate insulation and upper substrate through lithography and etching processes; forming a second conductor; sequentially etching the second conductor and first conductor through lithography and etching processes defining a portion to become as a gate; and forming a junction area.
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申请公布号 |
KR20000045480(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980062038 |
申请日期 |
1998.12.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
AHN, GWANG HO;HEO, YEON CHEOL |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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地址 |
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