发明名称 FABRICATION METHOD OF SOI DEVICE
摘要 PURPOSE: A fabrication method of SOI(Silicon On insulator) device is provided to realize DT-MOS device controllable threshold voltage in accordance with operational conditions without adding an area for connecting to a gate. CONSTITUTION: A fabrication method of SOI device comprises steps of: sequentially forming a gate insulation film and a first conductor on the SOI substrate on which a lower semiconductor substrate, an embedded insulation film and an upper semiconductor substrate are stacked; sequentially etching the first conductor, gate insulation and upper substrate through lithography and etching processes; forming a second conductor; sequentially etching the second conductor and first conductor through lithography and etching processes defining a portion to become as a gate; and forming a junction area.
申请公布号 KR20000045480(A) 申请公布日期 2000.07.15
申请号 KR19980062038 申请日期 1998.12.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 AHN, GWANG HO;HEO, YEON CHEOL
分类号 H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/336
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