| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device which enable use of a test device which is used has been used conventionally, even if the necessary number of terminals increases as the capacity becomes large. SOLUTION: This device is equipped with an address terminal A12 which is used in both normal operation and test mode, a bank select terminal BA0 which is used in the normal operation, but not used in the test mode, and a means which selects and supplies to an internal circuit a signal applied to the bank select terminal BA0, when a test signal indicates that the test mode or a signal applied to the address terminal A12, when the test signal indicates the normal operation.
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