发明名称 FABRICATION OF SEMICONDUCTOR ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a method for fabricating an easily separable semiconductor element at high yield. SOLUTION: A low temperature buffer layer 2, a first high temperature buffer layer 3, a second high temperature buffer layer 4, an n-contact layer 5, an MQW light emitting layer 6 comprising an alternating laminate of quantum barrier layers 6a and quantum well layers 6b, a protective layer 7, a p-clad layer 8 and a p-contact layer 9 are grown sequentially on the surface of a sapphire substrate 1. A cut trench 50 is then made from the p-contact layer 9 to the sapphire substrate 1 by dicing. Subsequently, etching is performed from the p-contact layer 9 to the n-contact layer 5 on the inner surface of the cut trench 50 to form an n-side electrode forming region 51 where the n- contact layer 5 is exposed.
申请公布号 JP2000196145(A) 申请公布日期 2000.07.14
申请号 JP19980372687 申请日期 1998.12.28
申请人 SANYO ELECTRIC CO LTD 发明人 OKAMOTO SHIGEYUKI;TOMINAGA KOJI;HATA MASAYUKI
分类号 H01L33/06;H01L33/12;H01L33/32;H01S5/00;H01S5/02;H01S5/323;H01S5/343 主分类号 H01L33/06
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