发明名称 NONVOLATILE SEMICONDUCTOR MEMORY AND ITS INSPECTION METHOD
摘要 <p>PROBLEM TO BE SOLVED: To efficiently ensure a write-in or erase voltage by providing a first write-in level decision means deciding a write-in level of a memory cell and a second write-in level decision means which is different from the first write-in level decision means. SOLUTION: At read-out time, a P-type MOS transistor Q4 is made in a conductive state by a 'Read' signal, and P-type MOS transistors Q5, Q3 are made in a cut-off state by a PV signal and an L1 signal, and a selected memory cell current is read out as a logic level signal. In first decision level operation at a write-in operation time, the transistor Q3 is made in the conductive state by the L1 signal, and whether or not threshold of all memory cells arrive at a first decision level is decided. Then, the transistor Q5 is made to conduct with the PV signal, and the write-in decision on a second decision level is performed.</p>
申请公布号 JP2000195299(A) 申请公布日期 2000.07.14
申请号 JP19980370711 申请日期 1998.12.25
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MISHIMA TOMOHITO
分类号 G11C17/00;G11C29/00;G11C29/12;(IPC1-7):G11C29/00 主分类号 G11C17/00
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