| 摘要 |
PROBLEM TO BE SOLVED: To secure a proper contact pressure, even if a circuit terminal interval becomes small by supporting contact pieces with an actuator, and elastically supporting contact sections to be kept in contact with the circuit terminals of a test circuit with a deformation section at the desired contact pressure. SOLUTION: Thin contact pieces 1 are supported by an actuator made of a high-pressure chamber 7 and a diaphragm 8, and contact sections 2 to be kept in contact with an electric conduction section 12 of a test circuit are elastically supported by a deformation section 3 at the desired contact pressure. High- pressure air is fed from an air feed port 9 and is filled in the high-pressure chamber 7, air pressure is applied to the air action sections of the thin contact pieces 1 via the diaphragm 8 applied with the air pressure, and depressing force is applied to their tip sections. The thin contact pieces 1 are regulated by a support plate 11 in 'no-test state'. When the electric conduction section 12 is moved upward in contact with the contact sections 2, the tip portions are lifted nearly vertically than the deformation section 3 with the air pressure kept applied. The high-pressure chamber 7 has the function of an air reservoir, thus the contact pressure is not changed in the lift process, and the proper contact pressure is maintained.
|
