发明名称 OPTICAL MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To make compensable a measuring error caused by a temp. change of an optical measuring apparatus and to make performable the compensation of a measuring error without using a thermostatic device. SOLUTION: The optical measuring apparatus is equipped with a light emitting part 2 for irradiating test specimen 9 with light, a measuring probe 5 equipped with a light detecting part having at least two light detecting parts 31, 32, a signal processing part 1 subjecting the detection signal detected by the light detecting part to signal processing and an emission wavelength calculating part 4 calculating the emission wavelength to the temp. of a light emitting part. The emission wavelength emitted at the present temp. by the light emitting part is calculated in the emission wavelength calculating part and signal processing is performed based on the calculated emission wavelength by the signal processing part and, on the basis of the temp.-wavelength characteristics of the light emitting part, the emission wavelength subjected to temp. correction is calculated from the temp. of the light emitting part and, by performing measurement based on the emission wavelength, the measuring error caused by a temp. range is compensated without using a thermostatic apparatus.
申请公布号 JP2000193585(A) 申请公布日期 2000.07.14
申请号 JP19980367245 申请日期 1998.12.24
申请人 SHIMADZU CORP 发明人 TAKEUCHI SADAO;KOBAYASHI MANAMI
分类号 A61B10/00;A61B5/145;A61B5/1455;A61B5/1495;G01N21/17;G01N33/72;(IPC1-7):G01N21/17 主分类号 A61B10/00
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