发明名称 METHOD AND SYSTEM FOR INSPECTING PATTERN DEFECT OF KEYBOARD OF VARIOUS ELECTRONIC DEVICES, AND COMPUTER- READABLE RECORDING MEDIUM WHERE PATTERN DEFECT INSPECTION PROGRAM IS RECORDED
摘要 PROBLEM TO BE SOLVED: To detect quickly and surely a defective part of an image to be inspected by using a simple method and to surely prevent judgment error due to unclear images by adjusting brightness. SOLUTION: A CCD line sensor camera 2 for taking an image data of a keyboard on the display surface, a brightness adjusting part 331 for adjusting the brightness of the image data which was taken-in, a first storage part 31 where a reference image data a after brightness-adjustment is stored, a second storage part 32 where a real image data after brightness adjustment is stored, a judgment part 332 where a real image made into a graphic based on the reference image data is divided into arbitrary small regions, and it is judged, for each small region, whether a region corresponding to the measure of small region is in a corresponding near region of the reference image made into graphic based on the reference image data or not, and a first defect detecting part 333 where if it is judged that the region corresponding to the measure of small region is not in a corresponding near region of the reference image, the region of real image corresponding to the small region is detected as a pattern defect region, are provided.
申请公布号 JP2000193437(A) 申请公布日期 2000.07.14
申请号 JP19980372467 申请日期 1998.12.28
申请人 KYOTO TRUST KK;POLYMATECH CO LTD 发明人 WADANO TAMOTSU;ITO SHIGEO;SASADA KAZUO;YAMAZAKI KOTA
分类号 G01B11/24;G01N21/88;G01N21/93;G06T1/00;G06T7/00 主分类号 G01B11/24
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