发明名称 GROUP III NITRIDE LASER DIODE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a group III nitride laser diode with a cleavage plane as a light resonator surface, while using a sapphire substrate, and its manufacturing method. SOLUTION: In a method for manufacturing a group III nitride laser diode, where a resonator surface is formed after group III nitride film made of AlxGayIn1-x-yN (0<=x, y, 0<=x+y<=1) is formed on a sapphire substrate with C surface as a substrate surface, the reverse side of a substrate 10 where a specific group III nitride film is laminated is polished and thinned, a scribe mark T is formed at the reverse side of the substrate in parallel with the crossing line between (1-100) surface that is the cleavage line of the group III nitride film and a substrate surface, and cutting is made along the scribe mark by a knife edge K, thus cleaving the group III nitride film to form a bar B2.
申请公布号 JP2000196186(A) 申请公布日期 2000.07.14
申请号 JP19980376897 申请日期 1998.12.25
申请人 FUJI ELECTRIC CO LTD 发明人 ONIZUKA TAKESHI;KANAMARU HIROSHI
分类号 H01S5/00;H01S5/10;H01S5/323;H01S5/343;(IPC1-7):H01S5/10 主分类号 H01S5/00
代理机构 代理人
主权项
地址