| 摘要 |
PROBLEM TO BE SOLVED: To shorten the time needed to read a defective analytic memory for the larger capacity of a tested memory. SOLUTION: All address regions of a defective analysis memory 118 is divided into N storage regions, and a defective block memory 130 is provided which has block addresses corresponding to as many as N divisions. If a failure occurs during a test, fail data are written to the block of the defective block memory 130 to which the address where the failure occurs belongs. In read mode, this defective block memory is read, and only the storage area of the defective analytic memory corresponding to the block where the fail data have been written is read.
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