| 摘要 |
PROBLEM TO BE SOLVED: To provide an input/output circuit of an integrated circuit with which one terminal can be shared between a test signal and a normal signal and high-speed transmission between LSIs can be realized. SOLUTION: The input/output circuit of an integrated circuit is composed of an input circuit having an input buffer 11 connected to an input terminal of the integrated circuit, and a flip flop 31 connected behind the input buffer which can be a through state, and an output circuit having a selector 1 for receiving a normal signal and a test signal, selecting and outputting either of the signals and a flip flop 30 which is set between the selector and an output terminal of the integrated circuit and which can be a through state. In testing the integrated circuit, the selector selects the test signal and, the flip flops of the input circuit and output circuit are turned to the through state.
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