发明名称 A METHOD AND APPARATUS THAT DETERMINES CHARGED PARTICLE BEAM SHAPE CODES
摘要 <p>A lithography method and apparatus which represent a substrate surface as gray level values and determine a shape data that specifies a shape and position of a flash field. The apparatus receives a pattern in a vector format, represents the substrate surface as a grid of pixels, and then represents each pixel as a gray level value specifying a proportion of the pixel that includes the pattern. Subsequently the apparatus constructs a matrix of a quadrant of four pixels and surrounding pixels, modifies the matrix so that three intermediate shapes corresponding to an exposed region of the quadrant may be provided, determines an intermediate shape data of the quadrant; and performs a reverse modification on the shape to determine the shape data that specifies a flash field.</p>
申请公布号 WO2000041207(A1) 申请公布日期 2000.07.13
申请号 US2000000095 申请日期 2000.01.04
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