发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE PACKAGE AND METAL DIE USED FOR THE SAME
摘要 PROBLEM TO BE SOLVED: To prevent generation of chip cracks at lead cutting, in order to prevent peeling of leads and resin at the interface, when a package is lifted. SOLUTION: A process for cutting the lead of package of which lead is exposed to the rear surface is included, and the lead is cut in this process under the condition that only a lead exposed part 1a of the rear surface of a package 1 is supported. Moreover, after cutting lead, only the lead exposed part 1a of the rear surface of package 1 is lifted for ejection during the process to eject the package. Thereby, even when a foreign matter such as resin is deposited to the center area of the rear surface of the package 1 at lead cutting, the stress is not concentrated to the area where the foreign matter is deposited, and thereby generation of package cracks and chip cracks which are serious faults can be prevented. Moreover, even if a situation arises in which the metal die cannot be separated easily from the package 1, a force which generates separation at the interface of the lead and resin is not be applied to the package 1.
申请公布号 JP2000196001(A) 申请公布日期 2000.07.14
申请号 JP19980372697 申请日期 1998.12.28
申请人 MATSUSHITA ELECTRONICS INDUSTRY CORP 发明人 YAMADA YASUHIRO;NANO MASANORI;OIDA SHIGEJI
分类号 B21D28/00;H01L23/50;(IPC1-7):H01L23/50 主分类号 B21D28/00
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