发明名称 METODE FLOROMETRI UNTUK MENINGKATKAN EFISIENSI PROSES PEMBILASAN DAN PROSES PEROLEHAN-KEMBALI AIR PADA PEMBUATAN CHIP SEMIKONDUKTOR
摘要 A method for determining wafer cleanliness by fluorometric monitoring of the impurities in the semiconductor chip wafer rinse solution. A clean chip is indicated by a leveling off of increased concentration of impurities as the rinsing of the chip progresses. A method for optimizing reuse or recyling of the water discharged from the rinse process which accurately measures the contaminants in that water.
申请公布号 ID24157(A) 申请公布日期 2000.07.13
申请号 ID20000000281 申请日期 1998.09.10
申请人 NALCO CHEMICAL COMPANY 发明人 BRIAN V. JENKINS;JOHN E. HOOTS
分类号 H01L21/304;H01L21/306;(IPC1-7):H01L21/00 主分类号 H01L21/304
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