发明名称 Method of forming a transistor having thin doped semiconductor gate
摘要 A method of forming a transistor is disclosed that comprises the step forming a gate insulator layer 12 on an outer surface of the substrate 10. A first gate conductor layer 22 is formed outwardly from the gate insulator layer 12. The first gate conductor layer 22 is extremely thin. Dopants are introduced into the layer 22 to render it conductive by using a diffusion source layer 24. The diffusion source layer 24 is then removed and replaced by a second gate conductor layer 26 having low resistance. The layer 26 can be used to form a T-gate structure 28, a flush gate 30, or a conventional gate structure.
申请公布号 US6087248(A) 申请公布日期 2000.07.11
申请号 US19990225878 申请日期 1999.01.05
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 RODDER, MARK STEPHEN
分类号 H01L21/28;H01L21/3215;H01L21/336;H01L29/49;(IPC1-7):H01L21/320 主分类号 H01L21/28
代理机构 代理人
主权项
地址