发明名称 |
Waveform sampling apparatus |
摘要 |
Disclosed is a waveform measuring apparatus in which an integration period T can be discretionally set to a value in accordance with the analog voltage cycle of the device being measured with a simple circuit configuration. The waveform measuring apparatus has an integrator circuit for integrating a fixed repeat-cycle analog input voltage during a period when a gate is ON and the waveform measuring apparatus converts the analog input voltage based on the integrated output of the integrator circuit. By use of a control portion consisting of a gate controller and a phase shifter, the first cycle of a period covering 2 cycles of the analog input voltage is deemed to be a first integration period and the second cycle thereof is deemed to be a second integration period; during the first integration period the gate ON/OFF is controlled using a control signal which alternates repeatedly between ON/OFF at each unit cycle corresponding to a unit integration time and during the second integration period the gate ON/OFF is controlled with a signal which is the inversion of the control signal.
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申请公布号 |
US6087825(A) |
申请公布日期 |
2000.07.11 |
申请号 |
US19970923388 |
申请日期 |
1997.09.03 |
申请人 |
ADVANTEST CORPORATION |
发明人 |
EGUCHI, HIROSHI;SAKAMOTO, KAZUO;YADA, EIICHI |
分类号 |
G01R19/25;G01R13/02;H03M1/50;(IPC1-7):G01R13/20 |
主分类号 |
G01R19/25 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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