发明名称 DRY ETCHING APPARATUS
摘要 PURPOSE: A dry etching apparatus is provided to be capable of quickly obtaining a micro size groove or hole, improving throughput, and increasing anisotropic characteristics and selectivity. CONSTITUTION: A dry etching apparatus is provided with a vacuum process chamber(1), a microwave generator(2) for generating the high frequency of 2.45 GHz, a discharge part(4) for generating gas plasma(5) by using the etching gas passed through a waveguide(3), and a solenoid coil(6) located at the peripheral portion of the discharge part. The discharge part includes a sample pedestal(7), and a wafer(8) loaded on the sample pedestal. The etching gas is exhausted from a gas inlet port(9) through the discharge part and the vacuum process chamber to an exhaust line(10) by using an exhaust pump(11).
申请公布号 KR100268114(B1) 申请公布日期 2000.07.11
申请号 KR19970010670 申请日期 1997.03.27
申请人 HITACHI, LTD. 发明人 KUMIHASHI TAKAO;TSUJIMOTO KAZUNORI;TACHI SHINICHI;KANEMOTO MASAFUMI;KOBAYASHI JUNICHI;USUI TATEHITO;MISE NOBUYUKI
分类号 C23F4/00;H01J37/32;H01L21/02;H01L21/205;H01L21/22;H01L21/285;H01L21/302;H01L21/3065;H01L21/311;H01L21/3213;(IPC1-7):H01L21/306 主分类号 C23F4/00
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