发明名称 TEST APPARATUS FOR INTERRUPT CONTROLLER
摘要 PURPOSE: A test apparatus for an interrupt controller is provided for generating an inner interrupt when developing an interrupt controller proper to a digital circuit using a known programmable logic device(PLD) for thereby implementing an easier management of a system having an interrupt controller. CONSTITUTION: A test apparatus for an interrupt controller includes an interrupt controller for receiving an inner or outer interrupt, adjusting an interrupt in accordance with a priority and requesting an interrupt to a microprocessor, an inner interrupt generator for generating an inner interrupt and supplying to an interrupt controller and a test unit for controlling an operation of an inner interrupt generator in accordance with an instruction of the microprocessor.
申请公布号 KR20000039223(A) 申请公布日期 2000.07.05
申请号 KR19980054488 申请日期 1998.12.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIL, YOUNG CHEOL
分类号 G06F11/00;(IPC1-7):G06F11/00 主分类号 G06F11/00
代理机构 代理人
主权项
地址