发明名称 |
TEST APPARATUS FOR INTERRUPT CONTROLLER |
摘要 |
PURPOSE: A test apparatus for an interrupt controller is provided for generating an inner interrupt when developing an interrupt controller proper to a digital circuit using a known programmable logic device(PLD) for thereby implementing an easier management of a system having an interrupt controller. CONSTITUTION: A test apparatus for an interrupt controller includes an interrupt controller for receiving an inner or outer interrupt, adjusting an interrupt in accordance with a priority and requesting an interrupt to a microprocessor, an inner interrupt generator for generating an inner interrupt and supplying to an interrupt controller and a test unit for controlling an operation of an inner interrupt generator in accordance with an instruction of the microprocessor.
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申请公布号 |
KR20000039223(A) |
申请公布日期 |
2000.07.05 |
申请号 |
KR19980054488 |
申请日期 |
1998.12.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIL, YOUNG CHEOL |
分类号 |
G06F11/00;(IPC1-7):G06F11/00 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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