发明名称 |
Process for manufacturing a resistive structure used in semiconductor integrated circuit |
摘要 |
<p>Process for manufacturing a resistive structure (1) comprising at least one semiconductor strip (2) laid above a semiconductor substrate (3) characterised in that it comprises the following steps of: covering with a mask (4) said semiconductor strip (2); forming a plurality of apertures (5) in said mask (4) until portions (6) of the semiconductor strip (2) are uncovered; implanting dopant in said semiconductor strip (2) through said apertures (5); subjecting the resistive structure (1) to a thermal process for diffusing the dopant in such a way to obtain a variable concentration profile in the semiconductor strip (2). <IMAGE></p> |
申请公布号 |
EP1017092(A1) |
申请公布日期 |
2000.07.05 |
申请号 |
EP19980830797 |
申请日期 |
1998.12.29 |
申请人 |
STMICROELECTRONICS S.R.L. |
发明人 |
SANTANGELO, ANTONELLO |
分类号 |
H01C17/00;H01L21/02;H01L21/266;(IPC1-7):H01L21/320 |
主分类号 |
H01C17/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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