发明名称 Process for manufacturing a resistive structure used in semiconductor integrated circuit
摘要 <p>Process for manufacturing a resistive structure (1) comprising at least one semiconductor strip (2) laid above a semiconductor substrate (3) characterised in that it comprises the following steps of: covering with a mask (4) said semiconductor strip (2); forming a plurality of apertures (5) in said mask (4) until portions (6) of the semiconductor strip (2) are uncovered; implanting dopant in said semiconductor strip (2) through said apertures (5); subjecting the resistive structure (1) to a thermal process for diffusing the dopant in such a way to obtain a variable concentration profile in the semiconductor strip (2). &lt;IMAGE&gt;</p>
申请公布号 EP1017092(A1) 申请公布日期 2000.07.05
申请号 EP19980830797 申请日期 1998.12.29
申请人 STMICROELECTRONICS S.R.L. 发明人 SANTANGELO, ANTONELLO
分类号 H01C17/00;H01L21/02;H01L21/266;(IPC1-7):H01L21/320 主分类号 H01C17/00
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