METHOD FOR MATCHING LOCATION OF THIN FILM PRINTED MATTER USING DISTORTION AND APPARATUS

摘要

PURPOSE: A method for matching the location of thin film printed matter using distortion and the apparatus thereby are provided so that the image of an object of inspection can be matched with a reference image, even though a deformed image is inputted, by carry out deformation compensation for image deformation as well as location compensation for the location movement of the inspection object image. CONSTITUTION: An image of an object of inspection is inputted from the external by an image input part(301). After more than 2 characteristic points of a reference image are set up at a characteristic point location measurement part(302), the characteristic point location of the inspection object image is measured(303). A first location compensation part and a deformation compensation part distort the inspection object image by the difference of the characteristic points(304).