发明名称 FABRICATION METHOD OF COMPOUND SEMICONDUCTOR DEVICE HAVING GATE ELECTRODE OF STAIRS TYPE
摘要 PURPOSE: A compound semiconductor device having a gate electrode of a stairs type is provided so as to improve a heat-resistibility and an insulating ability by using a two-steps etching process of a heat-resistible metal thin-layer and an insulating layer. CONSTITUTION: A fabrication method of the compound semiconductor device having the gate electrode of the stairs type contains the following processes: a process to compose an etch-stop layer, an ohmic layer, an insulation layer, and a heat-resistibility metal layer orderly on the compound semiconductor epitaxial substrate having several epitaxial layers; a process to form a gate insulation layer pattern of the stairs shape by etching the above heat-resistibility metal layer and insulation layer through the two-steps etching process; a process to form a gate recess pattern of T type pillar by etching the above ohmic contact layer and etch-stop layer through using a process of a two-steps gate recess to use a photo-resist pattern as a mask; a process to form the gate electrode of the stairs shape by lifting off the above photo-resist pattern, after evaporating in vacuum a gate metal on the above gate recess pattern; and a process to form a self-aligned source and drain electrode.
申请公布号 KR20000039191(A) 申请公布日期 2000.07.05
申请号 KR19980054446 申请日期 1998.12.11
申请人 KOREA ELECTRONIC & TELECOMMUNICATIONS RESEARCH INSTITUTE;KOREA TELECOM 发明人 YUN, HYEONG SEOB;LEE, JIN HI;BAK, BYUNG SEON;BAK, CEOL SUN
分类号 H01L21/18;(IPC1-7):H01L21/18 主分类号 H01L21/18
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