发明名称 |
FABRICATION METHOD OF COMPOUND SEMICONDUCTOR DEVICE HAVING GATE ELECTRODE OF STAIRS TYPE |
摘要 |
PURPOSE: A compound semiconductor device having a gate electrode of a stairs type is provided so as to improve a heat-resistibility and an insulating ability by using a two-steps etching process of a heat-resistible metal thin-layer and an insulating layer. CONSTITUTION: A fabrication method of the compound semiconductor device having the gate electrode of the stairs type contains the following processes: a process to compose an etch-stop layer, an ohmic layer, an insulation layer, and a heat-resistibility metal layer orderly on the compound semiconductor epitaxial substrate having several epitaxial layers; a process to form a gate insulation layer pattern of the stairs shape by etching the above heat-resistibility metal layer and insulation layer through the two-steps etching process; a process to form a gate recess pattern of T type pillar by etching the above ohmic contact layer and etch-stop layer through using a process of a two-steps gate recess to use a photo-resist pattern as a mask; a process to form the gate electrode of the stairs shape by lifting off the above photo-resist pattern, after evaporating in vacuum a gate metal on the above gate recess pattern; and a process to form a self-aligned source and drain electrode.
|
申请公布号 |
KR20000039191(A) |
申请公布日期 |
2000.07.05 |
申请号 |
KR19980054446 |
申请日期 |
1998.12.11 |
申请人 |
KOREA ELECTRONIC & TELECOMMUNICATIONS RESEARCH INSTITUTE;KOREA TELECOM |
发明人 |
YUN, HYEONG SEOB;LEE, JIN HI;BAK, BYUNG SEON;BAK, CEOL SUN |
分类号 |
H01L21/18;(IPC1-7):H01L21/18 |
主分类号 |
H01L21/18 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|