发明名称 |
METHOD FOR MANUFACTURING A PLUG OF SEMICONDUCTOR MEMORY |
摘要 |
PURPOSE: A plug formation method is provided to prevent a void generated in contact hole and cleaning processes by using double insulating layers without using nitride spacers. CONSTITUTION: Double insulating layers(3,6) are deposited on a substrate(1) having MOS transistors. The double insulating layers deposition steps further comprises the steps of depositing a first insulating layer(3) on the MOS transistor and etching an upper portion of the first insulating layer(3) located between gates of the MOS transistor, wherein the upper portion of the first insulating layer(3) is a void generation region; and depositing a second insulating layer(6) on the etched first insulating layer(3). Then, a contact hole for exposing a drain region of the MOS transistor is formed. A plug(5) is filled into the contact hole.
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申请公布号 |
KR20000037989(A) |
申请公布日期 |
2000.07.05 |
申请号 |
KR19980052827 |
申请日期 |
1998.12.03 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
KIM, WAN SU |
分类号 |
H01L27/10;(IPC1-7):H01L27/10 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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